Defects in PN Junctions and MOS Capacitors. . . Movie Review 1984

This program describes two methods (using thermally stimulated current and capacitance) for measuring, detecting, and characterizing lifetime and junction leakage. The film is available only to electronic engineers, physicists, and electronic engineering students.

Distribution

Modern Education Services, 3645 Crooks, Troy, MI 48084, Phone: (248)816-5050, Toll-free: 800-243-6877, Fax: (248)816-9119

Available on
Running time 35 minutes.

Cast and Crew

Genres

Electronics

Producer

National Bureau of Standards